The Effect of Deposition of Metal Charge Compensation Coating on Surface Morfology of Samples for SEM
Date
2018-01-01
Journal Title
Journal ISSN
Volume Title
Publisher
TANGER Ltd
Abstract
Description
Subject(s)
Atomic force microscopy, Crystal atomic structure, Deposition, Gold coatings, Nanostructured materials, Silicon wafers, Charge compensation, Coating material, Conductive surfaces, Deposition of metals, Deposition Parameters, Magnetic sputtering, Quantita
Citation
Item identifier
ISSN
ISBN
978-80-87294-81-9