The Effect of Deposition of Metal Charge Compensation Coating on Surface Morfology of Samples for SEM

Date
2018
Journal Title
Journal ISSN
Volume Title
Publisher
TANGER Ltd
Abstract
Description
Subject(s)
Atomic force microscopy, Crystal atomic structure, Deposition, Gold coatings, Nanostructured materials, Silicon wafers, Charge compensation, Coating material, Conductive surfaces, Deposition of metals, Deposition Parameters, Magnetic sputtering, Quantita
Citation
ISSN
ISBN
978-80-87294-81-9
Collections