Sequential Test Decompressors with Fast Tester Bits Wide-Spreading

Date
2017
Journal Title
Journal ISSN
Volume Title
Publisher
WORLD SCIENTIFIC PUBL CO PTE LTD, 5 TOH TUCK LINK, SINGAPORE 596224
Abstract
Description
Subject(s)
Design for testability, hardware-based test vector compression technique, linear-decompression-based scheme
Citation
ISSN
0218-1266
ISBN
Collections