Sequential Test Decompressors with Fast Tester Bits Wide-Spreading

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dc.contributor.authorNovák Ondřejcs
dc.contributor.authorRozkovec Martincs
dc.contributor.authorJeníček Jiřícs
dc.date.accessioned2018-09-25T12:11:22Z
dc.date.available2018-09-25T12:11:22Z
dc.date.issued2017cs
dc.format.extent16cs
dc.identifier.doi10.1142/S0218126617400011
dc.identifier.issn0218-1266cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/30800
dc.language.isoengcs
dc.publisherWORLD SCIENTIFIC PUBL CO PTE LTD, 5 TOH TUCK LINK, SINGAPORE 596224cs
dc.publisher.citySINGAPOREcs
dc.relation.ispartofseries0cs
dc.relation.urihttp://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011cs
dc.subjectDesign for testabilitycs
dc.subjecthardware-based test vector compression techniquecs
dc.subjectlinear-decompression-based schemecs
dc.titleSequential Test Decompressors with Fast Tester Bits Wide-Spreadingen
dc.titleSequential Test Decompressors with Fast Tester Bits Wide-Spreadingcs
local.identifier.publikace4250
local.identifier.wok000399226200002en
local.relation.issue8cs
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