Sequential Test Decompressors with Fast Tester Bits Wide-Spreading
dc.contributor.author | Novák Ondřej | cs |
dc.contributor.author | Rozkovec Martin | cs |
dc.contributor.author | Jeníček Jiří | cs |
dc.date.accessioned | 2018-09-25T12:11:22Z | |
dc.date.available | 2018-09-25T12:11:22Z | |
dc.date.issued | 2017 | cs |
dc.format.extent | 16 | cs |
dc.identifier.doi | 10.1142/S0218126617400011 | |
dc.identifier.issn | 0218-1266 | cs |
dc.identifier.uri | https://dspace.tul.cz/handle/15240/30800 | |
dc.language.iso | eng | cs |
dc.publisher | WORLD SCIENTIFIC PUBL CO PTE LTD, 5 TOH TUCK LINK, SINGAPORE 596224 | cs |
dc.publisher.city | SINGAPORE | cs |
dc.relation.ispartofseries | 0 | cs |
dc.relation.uri | http://www.worldscientific.com/doi/pdf/10.1142/S0218126617400011 | cs |
dc.subject | Design for testability | cs |
dc.subject | hardware-based test vector compression technique | cs |
dc.subject | linear-decompression-based scheme | cs |
dc.title | Sequential Test Decompressors with Fast Tester Bits Wide-Spreading | en |
dc.title | Sequential Test Decompressors with Fast Tester Bits Wide-Spreading | cs |
local.identifier.publikace | 4250 | |
local.identifier.wok | 000399226200002 | en |
local.relation.issue | 8 | cs |