Advanced measurements and reliability assessments in modern nanoscale FPGAs

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dc.contributor.authorPfeifer Petrcs
dc.date.accessioned2018-09-25T12:06:25Z
dc.date.available2018-09-25T12:06:25Z
dc.date.issued2015cs
dc.format.extent1cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/30039
dc.language.isoengcs
dc.publisherTallinn University of Technologycs
dc.publisher.cityTallinncs
dc.relation.ispartofseries1cs
dc.relation.urihttp://iktdk.dcc.ttu.ee/data/iktdk_conf_call_2014.pdfcs
dc.subjectnanoscalecs
dc.subjectFPGAcs
dc.subjectreliabilitycs
dc.titleAdvanced measurements and reliability assessments in modern nanoscale FPGAscs
local.citation.epage2cs
local.citation.spage2cs
local.identifier.publikace3472
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