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Advanced measurements and reliability assessments in modern nanoscale FPGAs
Advanced measurements and reliability assessments in modern nanoscale FPGAs
Date
2015
Authors
Pfeifer Petr
Journal Title
Journal ISSN
Volume Title
Publisher
Tallinn University of Technology
Abstract
Description
Subject(s)
nanoscale
,
FPGA
,
reliability
Citation
Item identifier
https://dspace.tul.cz/handle/15240/30039
ISSN
ISBN
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