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Advanced measurements and reliability assessments in modern nanoscale FPGAs
Advanced measurements and reliability assessments in modern nanoscale FPGAs
Date
2015-01-01
Authors
Pfeifer Petr
Journal Title
Journal ISSN
Volume Title
Publisher
Tallinn University of Technology
Abstract
Description
Subject(s)
nanoscale
,
FPGA
,
reliability
Citation
Item identifier
https://dspace.tul.cz/handle/15240/30039
ISSN
ISBN
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