Sequential Test Decompressors with Fast Variable Wide Spreading
dc.contributor.author | Novák Ondřej | cs |
dc.contributor.author | Jeníček Jiří | cs |
dc.contributor.author | Rozkovec Martin | cs |
dc.date.accessioned | 2018-09-25T11:45:54Z | |
dc.date.available | 2018-09-25T11:45:54Z | |
dc.date.issued | 2016-01-01 | cs |
dc.format.extent | 6 | cs |
dc.identifier.doi | 10.1109/DDECS.2016.7482454 | |
dc.identifier.isbn | 978-1-5090-2816-0 | cs |
dc.identifier.uri | https://dspace.tul.cz/handle/15240/27002 | |
dc.language.iso | eng | cs |
dc.publisher | IEEE | cs |
dc.publisher.city | Košice, Slovakia | cs |
dc.relation.ispartofseries | 0 | cs |
dc.relation.uri | http://ddecs2016.fiit.stuba.sk/DDECS_2016/ | cs |
dc.subject | integrated circuit design | cs |
dc.subject | design for testability (DFT) | cs |
dc.subject | scan-based test | cs |
dc.subject | linear finite state machines | cs |
dc.subject | test application time reduction | cs |
dc.subject | test data compression | cs |
dc.subject | hardware-based test vector linear-decompression scheme | cs |
dc.title | Sequential Test Decompressors with Fast Variable Wide Spreading | en |
dc.title | Sequential test decompressors with fast variable wide spreading | cs |
local.citation.epage | 132-137 | cs |
local.citation.spage | 132-137 | cs |
local.identifier.publikace | 295 |