Sequential Test Decompressors with Fast Variable Wide Spreading
Date
2016
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Description
Subject(s)
integrated circuit design, design for testability (DFT), scan-based test, linear finite state machines, test application time reduction, test data compression, hardware-based test vector linear-decompression scheme
Citation
ISSN
ISBN
978-1-5090-2816-0