Surface Profilometry by Digital Holography
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Date
2018
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Abstract
This paper presents newly developed method for measurement of surface topography based on frequency scanning digital holography. Digital holography allows for direct computation of the phase field of the wavefront scattered by an object. A tuning of the light source optical frequency results in linear phase variation with respect to the optical frequency. Slope of the linear function in every single pixel corresponds to absolute measurement of optical path difference and thus topography map of the surface can be retrieved. Principle of this contactless method is introduced and experimentally verified. The method can be used for measurement of complex geometries of common manufacturing parts as well as for topography measurement of complex composite structures, and active acoustic metasurfaces.
Description
Subject(s)
Surface profilometry, digital holography, frequency scanning, absolute measurement
Citation
ISSN
1946-0740
ISBN
978-1-5090-6505-9