Browsing by Author "Kaván František"
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- ItemAdvanced measurement procedure for interferometric microscope for three-dimensional imaging of complex surfaces using two-wavelength interferometry and reference arm attenuation(IFSA Publishing, S.L., 2020-01-01) Stašík Marek; Kaván František; Mach Marek; Sedláčková Karolína; Kredba Jan; Špína Michal
- ItemDigital Holographic Tomography for 3D imaging of Ferroelectric Single-Crystal Domain Walls(2019-01-01) Mach Marek; Kaván František; Psota Pavel; Mokrý Pavel; Lédl Vít
- ItemFrequency Sweeping Digital Holography in Fourier Arrangement for Topography Measurement of Complex Surfaces(OSA, 2019-01-01) Kaván František; Psota Pavel
- ItemLarge Displacement And Deformation Measurement by Frequency Sweeping Digital Holography(2017-01-01) Psota Pavel; Matoušek Ondřej; Doleček Roman; Kaván František; Lédl Vít
- ItemMechanical Properties of Titanium-Aluminium base nanomultilayer coatings(J. E. Purkyne University in Usti nad Labem, 2016-01-01) Bakalova Totka; Petkov Nikolay; Cholakova Tetiana; Bahchedzhiev Hristo; Kaván František
- ItemParameter optimization of frequency sweeping digital holography for the measurement of ground optical surfaces(OPTICAL SOC AMER, 2021-01-01) Kaván František; Psota Pavel; Mach Marek; Stašík Marek; Lédl Vít
- ItemParameter optimization of frequency sweeping digital holography for the measurement of ground optical surfaces(2021-01-01) Kaván František; Mach Marek; Stašík Marek
- ItemSurface Profilometry by Digital Holography(IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA, 2018-01-01) Psota Pavel; Lédl Vít; Kaván František; Mokrý Pavel; Matoušek OndřejThis paper presents newly developed method for measurement of surface topography based on frequency scanning digital holography. Digital holography allows for direct computation of the phase field of the wavefront scattered by an object. A tuning of the light source optical frequency results in linear phase variation with respect to the optical frequency. Slope of the linear function in every single pixel corresponds to absolute measurement of optical path difference and thus topography map of the surface can be retrieved. Principle of this contactless method is introduced and experimentally verified. The method can be used for measurement of complex geometries of common manufacturing parts as well as for topography measurement of complex composite structures, and active acoustic metasurfaces.
- ItemTwo-wavelengths Interferometry as Confocal Microscope Extension to Provide 3D Imaging Capabilities(IFSA Publishing, S.L., 2020-01-01) Stašík Marek; Kaván František; Mach Marek; Sedláčková Karolína; Kredba Jan; Špína Michal
- ItemTwo-wavelengths Interferometry as Confocal Microscope Extension to Provide 3D Imaging Capabilities(IFSA Publishing, 2020-01-01) Stašík Marek; Kaván František; Mach Marek; Sedláčková Karolína; Kredba Jan; Špína Michal
- ItemTwo-wavelengths Interferometry as Confocal Microscope Extension to Provide 3D Imaging Capabilities(IFSA Publishing, 2021-01-01) Stašík Marek; Kaván František; Mach Marek; Kredba Jan; Sedláčková Karolína; Špína Michal