Thick platinum films as low temperature thermometers

Abstract
Resistance measurements of thick platinum films between 4.2 and 300 K are reported. The thick films were prepared by standard screen-printing techniques. The properties of the films make them suitable for low temperature thermometry. In the temperature range 77-300 K experimental data are fitted using a quadratic fit with an error in temperature of less than 0.2%. © 1992.
Description
Subject(s)
platinum resistance thermometers, thermometers, thick films
Citation
ISSN
0011-2275
ISBN
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