The Usage of Backscattered Electrons in Scanning Electron Microscopy

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dc.contributor.authorKejzlar Pavelcs
dc.contributor.authorŠvec Martincs
dc.contributor.authorMacajová Evacs
dc.date.accessioned2018-09-25T11:45:25Z
dc.date.available2018-09-25T11:45:25Z
dc.date.issued2014cs
dc.format.extent4cs
dc.identifier.issn1213-2489cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/26928
dc.language.isoengcs
dc.publisherJ.E.Purkyne Universitycs
dc.publisher.cityÚstí nad Labemcs
dc.relation.ispartofseries1cs
dc.subjectSEMcs
dc.subjectBSEcs
dc.subjectStructurecs
dc.titleThe Usage of Backscattered Electrons in Scanning Electron Microscopycs
local.citation.epage333-336cs
local.citation.spage333-336cs
local.identifier.publikace216
local.relation.issue3cs
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