Comparison of Evaluating Methods of Thin Films Nanohardness
dc.contributor.author | Hájková Pavlína | cs |
dc.contributor.author | Louda Petr | cs |
dc.contributor.author | Špatenka Petr | cs |
dc.date.accessioned | 2018-09-25T12:17:29Z | |
dc.date.available | 2018-09-25T12:17:29Z | |
dc.date.issued | 2006 | cs |
dc.format.extent | 7 | cs |
dc.identifier.doi | 10.1007/s10582-006-0344-7 | |
dc.identifier.issn | 00114626 | cs |
dc.identifier.uri | https://dspace.tul.cz/handle/15240/31674 | |
dc.language.iso | eng | cs |
dc.publisher | Springer | cs |
dc.publisher.city | Praha | cs |
dc.relation.ispartofseries | 0 | cs |
dc.relation.uri | https://link.springer.com/content/pdf/10.1007/s10582-006-0344-7.pdf | cs |
dc.subject | Berkovich indenter | cs |
dc.subject | Nanohardness | cs |
dc.subject | Sapphire | cs |
dc.subject | Spinel | cs |
dc.subject | Vickers indenter | cs |
dc.title | Comparison of Evaluating Methods of Thin Films Nanohardness | cs |
local.citation.epage | "B1162"-"B1168& | cs |
local.citation.spage | "B1162"-"B1168& | cs |
local.identifier.publikace | 5138 | |
local.identifier.wok | 000241337000020 | en |