Comparison of Evaluating Methods of Thin Films Nanohardness

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dc.contributor.authorHájková Pavlínacs
dc.contributor.authorLouda Petrcs
dc.contributor.authorŠpatenka Petrcs
dc.date.accessioned2018-09-25T12:17:29Z
dc.date.available2018-09-25T12:17:29Z
dc.date.issued2006-01-01cs
dc.format.extent7cs
dc.identifier.doi10.1007/s10582-006-0344-7
dc.identifier.issn00114626cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/31674
dc.language.isoengcs
dc.publisherSpringercs
dc.publisher.cityPrahacs
dc.relation.ispartofseries0cs
dc.relation.urihttps://link.springer.com/content/pdf/10.1007/s10582-006-0344-7.pdfcs
dc.subjectBerkovich indentercs
dc.subjectNanohardnesscs
dc.subjectSapphirecs
dc.subjectSpinelcs
dc.subjectVickers indentercs
dc.titleComparison of Evaluating Methods of Thin Films Nanohardnesscs
local.citation.epage"B1162"-"B1168&cs
local.citation.spage"B1162"-"B1168&cs
local.identifier.publikace5138
local.identifier.wok000241337000020en
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