Nonlinear binary codes and their utilization for test

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dc.contributor.authorNovák Ondřejcs
dc.date.accessioned2020-06-08T09:38:30Z
dc.date.available15-43-2019en
dc.date.available2020-06-08T09:38:30Z
dc.date.issued2018-01-01cs
dc.date.updated26-18-2019en
dc.format.extent6cs
dc.identifier.doi10.1109/DDECS.2018.00010
dc.identifier.isbn9781538657546cs
dc.identifier.issn2473-2117cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/155522
dc.language.isoengcs
dc.publisherIEEEcs
dc.relation.ispartof2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits &amp Systems (DDECS)en
dc.relation.ispartofseries1cs
dc.relation.urihttp://xplorestaging.ieee.org/ielx7/8372378/8410489/08410499.pdf?arnumber=8410499cs
dc.riv.kontrolni-cislo192065190cs
dc.riv.specifikaceRIV/46747885:24220/18:00006124!RIV19-MSM-24220___cs
dc.subjectBuilt-in self-testcs
dc.subjectDesign for testabilitycs
dc.subjectBinary codescs
dc.subjectNonlinear codescs
dc.titleNonlinear binary codes and their utilization for testen
dc.titleNonlinear binary codes and their utilization for testcs
local.citation.epage15-20cs
local.citation.spage15-20cs
local.event.locationBudapesten
local.identifier.publikace6124
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