Extended binary nonlinear codes and their application in testing and compression

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dc.contributor.authorNovák, Ondřejcs
dc.date.accessioned2018-09-25T12:15:19Z
dc.date.available2018-09-25T12:15:19Z
dc.date.issued2017cs
dc.description.abstractIn this paper, we show that the binary linear codes can be extended by a relatively big number of check bits in such a way that the code words preserve the value of a maximum number of independently specified bits from the original linear code words. It can improve pattern compression and-or pseudo-exhaustive testing. Existing linear compression and testing techniques adopt linear codes either for pattern expansion in the decompressor or for pattern generation. The minimum code distance of the dual linear code determines the encoding efficiency, the greater distance causes the bigger maximum number of independently specified bits on the decompressor outputs. While keeping the number of specified bits for longer code words the extended codes provide a possibility of feeding more parallel scan chains with the decompressor output bits. In the case of pseudo-exhaustive test pattern generators, the extended nonlinear codes guarantee an existence of the universal pseudo-exhaustive test set with better parameters than can be obtained for linear test pattern generators. We compare the properties of the extended non-linear and linear codes and demonstrate the effectiveness of the decompressors using these codes.en
dc.format.extent2cs
dc.identifier.doi10.1109/ETS.2017.7968244
dc.identifier.isbn978-1-5090-5457-2cs
dc.identifier.issn15301877cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/31382
dc.identifier.urihttps://ieeexplore.ieee.org/document/7968244
dc.language.isoengcs
dc.publisherIEEEcs
dc.publisher.cityLimassolcs
dc.relation.ispartofseries1cs
dc.relation.urihttp://ieeexplore.ieee.org/document/7968244/cs
dc.subjectautomatic test pattern generationcs
dc.subjectbinary codescs
dc.subjectlinear codescs
dc.subjectlogic testingcs
dc.subjectnonlinear codescs
dc.subjectbinary nonlinear codescs
dc.subjectlinear test pattern generatorscs
dc.subjectpattern compressioncs
dc.subjectpattern generationcs
dc.subjectpseudoexhaustive test pattern generatorscs
dc.subjectAutomatacs
dc.subjectCombinational circuitcs
dc.titleExtended binary nonlinear codes and their application in testing and compressionen
dc.titleExtended binary nonlinear codes and their application in testing and compressioncs
local.citation.epage1-2cs
local.citation.spage1-2cs
local.identifier.publikace4845
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