Domain formation in thin ferroelectric films: The role of depolarization energy

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dc.contributor.authorKopal, Antonín
dc.contributor.authorBahník, Tomáš
dc.contributor.authorFousek, Jan
dc.date.accessioned2016-07-08
dc.date.available2016-07-08
dc.date.issued1997
dc.description.abstractFormulae for equlibrium stripe domain width Weq in a nonductive ferroelectric plate of thickness d are deduced, taking into account electrostatic interaction of surfaces. It is shown that the classical formula giving W eq ∞ d 1/2 is not applicable when the sample thickness decreases below the value dcrit which is a function of dielectric properties and domain wall energy density. For many ferroelectrics the value of dcrit lies in a range which can be easily reached far below the transition point by contemporary thin film techniques; it further increases as the transition point is approached. In the region d < dcrit the width Weq increases with decreasing d. For samples with thickness d << dcrit the domain structure becomes insensitive to electrical boundary conditions and will be primarily determined by other factors.en
dc.formattext
dc.identifier.issn0015-0193
dc.identifier.scopus2-s2.0-0031363832
dc.identifier.urihttps://dspace.tul.cz/handle/15240/16613
dc.language.isoen
dc.relation.ispartofFerroelectrics
dc.relation.ispartofFerroelectricsen
dc.sourcej-scopus
dc.titleDomain formation in thin ferroelectric films: The role of depolarization energyen
dc.typearticle
local.accessaccess
local.citation.epage274
local.citation.spage267
local.departmentDepartment of Physics
local.facultyFaculty of Sciences, Humanities and Education
local.fulltextyes
local.identifier.codenFEROA
local.notenefunguje RIV
local.relation.issue1-4
local.relation.volume202
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