Advanced measurement procedure for interferometric microscope for three-dimensional imaging of complex surfaces using two-wavelength interferometry and reference arm attenuation

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dc.contributor.authorStašík Marekcs
dc.contributor.authorKaván Františekcs
dc.contributor.authorMach Marekcs
dc.contributor.authorSedláčková Karolínacs
dc.contributor.authorKredba Jancs
dc.contributor.authorŠpína Michalcs
dc.date.accessioned2021-01-14T18:07:50Z
dc.date.available03-39-2021en
dc.date.available2021-01-14T18:07:50Z
dc.date.issued2020cs
dc.date.updated10-25-2021en
dc.format.extent10cs
dc.identifier.issn2306-8515cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/158728
dc.language.isoengcs
dc.publisherIFSA Publishing, S.L.cs
dc.publisher.cityBarcelonacs
dc.relation.ispartofSensors &amp Transducers journalen
dc.relation.ispartofseries0cs
dc.relation.urihttps://www.sensorsportal.com/HTML/DIGEST/P_3191.htmcs
dc.subjectmicroscopecs
dc.subjectinterferometrycs
dc.subjectphase shiftingcs
dc.subjectBragg cellcs
dc.subjectacousto-optic modulatorcs
dc.subjectmultiwavelength interferometrycs
dc.subjecthigh dynamic rangecs
dc.titleAdvanced measurement procedure for interferometric microscope for three-dimensional imaging of complex surfaces using two-wavelength interferometry and reference arm attenuationcs
local.citation.epage13-22cs
local.citation.spage13-22cs
local.identifier.publikace8055
local.relation.issue8/20cs
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