Effect of CoSi2 interfacial layer on the magnetic properties of Si ORCoSi2 ORSm-Co thin films

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dc.contributor.authorSaravanan P.cs
dc.contributor.authorBoominathasellarajan Sellakumarcs
dc.contributor.authorSobel Bartłomiejcs
dc.contributor.authorWaclawek Stanislaw Witoldcs
dc.contributor.authorVellora Thekkae Padil Vinodcs
dc.contributor.authorČerník Miroslavcs
dc.date.accessioned2020-06-08T09:44:55Z
dc.date.available27-35-2019en
dc.date.available2020-06-08T09:44:55Z
dc.date.issued2020cs
dc.date.updated23-24-2020en
dc.format.extent6cs
dc.identifier.doi10.1016/j.jmmm.2019.165716
dc.identifier.issn0304-8853cs
dc.identifier.urihttps://dspace.tul.cz/handle/15240/156134
dc.language.isoengcs
dc.publisherElseviercs
dc.relation.ispartofJournal of Magnetism and Magnetic Materialsen
dc.relation.ispartofseries0cs
dc.relation.urihttps://www.sciencedirect.com/science/article/pii/S0304885319300344cs
dc.subjectMagnetic thin filmscs
dc.subjectCobalt silicidecs
dc.subjectSm-Cocs
dc.subjectTransmission electron microscopycs
dc.subjectThermo-magnetic measurementscs
dc.titleEffect of CoSi2 interfacial layer on the magnetic properties of Si ORCoSi2 ORSm-Co thin filmscs
local.citation.epage165716cs
local.citation.spage165716cs
local.identifier.publikace6820
local.relation.issueJanuarycs
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