Test Decompressor Effectivity Improvement
Date
2016
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Description
Subject(s)
integrated circuit design, design for testability (DFT), scan-based test, linear finite state machines, manufacturing test, test application time reduction, test data volume compression. hardware-based test vector compression technique, linear-decompress
Citation
ISSN
ISBN
978-1-5090-2816-0