Random temporal laser speckles for the robust measurement of sub-microsecond photoluminescence decay
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Date
2020-04-13
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OPTICAL SOC AMER, 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA
Abstract
Time-resolved photoluminescence (PL) is commonly used to track dynamics in a broad range of materials. Thus, the search for simplification of the acquisition of PL kinetics attracts continuous attention. This paper presents a new robust and straightforward approach to the measurement of PL decay, which is based on randomly fluctuating excitation intensity. The random excitation waveform is attained by using laser speckles generated on a rotating diffuser. Owing to this, the presented technique is able to utilize any coherent excitation source without the necessity to generate short pulses or to controllably modulate the light. PL decay can be computationally reconstructed from the Fourier image of the PL trace. The paper demonstrates the performance of the method, which is able to acquire sub-microsecond dynamics as the impulse response function reaches 300 ns. The reconstructed PL decays were compared to streak camera measurements to verify the method. Finally, potential limitations and applications of the technique are discussed.